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book article

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

book article
2

book article

Bringing research issues into lab scenarios on the example of SoC testing [Electronic resource]Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei; Wuttke, Heinz-DietrichInternational Conference on Engineering Education - ICEE 2007 : September 3-7, 2007, Coimbra, Portugal2007 / [7] p. : ill. [CD-ROM] http://icee2007.dei.uc.pt/proceedings/papers/429.pdf

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3

journal article

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill http://dx.doi.org/10.1016/j.micpro.2014.11.002

journal article
4

book article EST / book article ENG

Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentationOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings2018 / 5 p.: ill https://doi.org/10.1109/ISCAS.2018.8350936 Conference proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG
5

book article

Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cellsAzad, Siavoosh Payandeh; Oyeniran, Adeboye Stephen; Ubar, Raimund-Johannes21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings2018 / p. 21-26 : ill https://doi.org/10.1109/DDECS.2018.00011

book article
6

book article

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

book article
7

book article

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496466

book article

Number of records 7, displaying 1 - 7

1. built-in self-test
2. logic built-in self-test
3. functional self-test
4. self-test
5. self-test architectures
6. software based self-test
7. software-based self-test
8. software-based self-test (SBST)
9. As-built
10. built environment
11. built environment and architecture
12. built environment investment
13. built environment skills needs
14. built in moisture
15. built-in moisture
16. Built-in transformer (BIT)
17. cultural built heritage
18. sustainable built environment
19. adolescent self-efficacy
20. association of local-self government
21. association of local-self governments
22. corporate energy self-sufficiency
23. covalent self-assembly in solid state
24. diffusion and self-trapping of charge carriers
25. digital self-determination
26. digital self-efficacy
27. digital self-interference cancellation
28. European charter of local self-government
29. European self-sovereign identity framework
30. high strength self-compacting concrete
31. income of self-employed
32. increased self-consumption
33. local self-government
34. nikel-based self-fluxing alloy
35. NiP self-lubricating coating
36. open self‐ventilated machines
37. optical self-mixing
38. OSV (open self‐ventilated) machines
39. perceived general self-efficacy
40. renewables self-consumption
41. Self assessment tool
42. self aware
43. self learning software
44. self learning system
45. Self organization
46. self organizing map
47. self organizing network
48. self regulating heating
49. self regulation
50. self-analysis
51. self-assembled monolayers
52. self-assembly
53. self-assessed quality of life
54. self-assessment
55. self-assessment tool
56. self-aware contracts
57. self-aware systems
58. self-awareness
59. self-checking
60. self-cleaning surfaces
61. self-consistent channels
62. self-consumption
63. self-costs
64. self-defence
65. self-determination
66. self-determination theory
67. self-determination theory of work motivation
68. self-development
69. self-driving car
70. self-driving cars
71. self-driving minibus
72. self-driving vehicle
73. self-driving vehicles
74. self-efficacy
75. self-efficacy development
76. self-employed
77. self-employment
78. self-evaluation
79. self-fluxing alloy
80. self-governance
81. self-healing
82. self-heating phenomenon
83. self-identification
84. self-identity
85. self-improvement
86. self-insurance
87. self-learning
88. self-lubrication
89. self-management
90. self‐management
91. self-mixing
92. self-organisation
93. self-organised teams
94. self-organization
95. self-organized criticality
96. self-organized teams
97. self-perforating dowel
98. self-propagating high temperature synthesized (SHS)
99. Self-Propagating High-Temperature Synthesis
100. self-propulsion
101. self-regulated learning
102. self-regulation
103. self-reported musculoskeletal disorders
104. self-rolling
105. self-shading envelopes
106. self-study
107. self-study courses
108. self-training
109. social self-development
110. accelerated shelf-life test
111. adaptive test strategy generation
112. antigen test
113. ASTM G65 dry sand rubber wheel abrasion test
114. automated test environment
115. automated test pattern generation
116. automatic test case generation
117. automatic test pattern generation
118. automatic test program generation
119. Auvergne test-bed
120. battery test
121. behavioral test
122. behaviour level test generation
123. bending test
124. bit-error rate test
125. Board and System Test
126. board test
127. bounds test
128. capillary condensation redistribution test
129. chi-square test
130. closed bottle test
131. cognitive screening test
132. compartment fire test
133. compartment test
134. cone penetration test (CPT)
135. COVID-19 antigen test
136. cutting test
137. cybersecurity test bed
138. DDR4 interconnect test
139. design and test
140. design-for-test
141. deterministic test sequences
142. diagnostic test
143. digital test
144. Digital test and testable design
145. double-pulse test
146. drawing test
147. dry droplet antimicrobial test
148. embedded test
149. fan pressurisation test
150. final test result prediction
151. four-point bending test
152. FPGA based test
153. FPGA-Assisted Test
154. FPGA-centric test
155. functional test generation
156. Granger causality test
157. hardness test
158. high-level synthesis for test
159. high-level test data generation
160. highlevel test generation
161. high-speed serial link test
162. IEEE 9 bus test system
163. implementation-independent test generation
164. in situ tensile test in SEM
165. industrial field test
166. in-situ tensile test in SEM
167. Johansen cointegration test
168. Kolmogorov-Smirnov test
169. load test
170. Luria alternating series test
171. Mann–Kendall test
172. memory interconnect test
173. microprocessor test
174. Model test
175. multiplier test
176. offline test generation
177. orthogonal test
178. package test analysis
179. parallel design and test
180. performance test
181. piezocone penetration test (CPTu)
182. Point Load Test index
183. pressurisation test
184. processor-centric board test
185. progressive damage test
186. provably correct test generation
187. pseudo-exhaustive test
188. purity test
189. rtioco-based timed test sequences
190. seasonal Mann Kendall test
191. seismic piezocone penetration test
192. sentence writing test
193. serial sevens test
194. ship towing test tank
195. similar material simulation test
196. small-scale fire test
197. small‐scale test
198. soil phosphorus (P) test
199. standard test method
200. static load test
201. static-dynamic probing test (SDT)
202. stress test
203. system level test
204. teaching design and test of systems
205. tensile test
206. test
207. test and evaluation platform
208. test bench
209. test coverage
210. test driven development
211. test driven modelling
212. test embankment
213. test equipment
214. test generation
215. test generation and fault diagnosis
216. test groups
217. test model design
218. test optimization
219. test packets
220. test path synthesis
221. test patterns
222. test point insertion
223. test program generation
224. test reference year
225. test replication
226. test scenario description language
227. test-bed
228. test-chips
229. test-house
230. test-pattern
231. test-suite reduction
232. Three-point bending test
233. unit root test
234. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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