At-speed functional built-in self-test methodology for processors [Electronic resource]
statement of authorship
Raimund Ubar, Viljar Indus, Oliver Kalmend
source
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
location of publication
[S.l.]
publisher
IASTED
year of publication
pages
p. 168-172 : ill [CD-ROM]
series
A publication of the international Association of Science and Technology for Development ; 785
conference name, date
IASTED International Conference on Engineering and Applied Science, December 27-29, 2012
conference location
Columbo, Sri Lanka
subject term
keyword
ISBN
978-0-88986-941-7
notes
Bibliogr.: 18 ref
TTÜ department
language
inglise
Ubar, R., Indus, V., Kalmend, O. At-speed functional built-in self-test methodology for processors [Electronic resource] // Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka. [S.l.] : IASTED, 2012. p. 168-172 : ill [CD-ROM]. (A publication of the international Association of Science and Technology for Development ; 785).