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Untestable fault identification in sequential circuits using model-checking (title)
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book article
Untestable fault identification in sequential circuits using model-checking
Raik, Jaan
;
Fujiwara, Hideo
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
Proceedings of the 17th Asian Test Symposium ATS 2008 : November 24-27, 2008, Sapporo, Japan
2008
/
p. 21-26 : ill
http://dx.doi.org/10.1109/ATS.2008.22
book article
2
book article
Untestable fault identification in sequential circuits using model-checking
Raik, Jaan
;
Fujiwara, Hideo
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium
2011
/
p. 257-262 : ill
https://ieeexplore.ieee.org/document/4711554
book article
Number of records 2, displaying
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keyword
13
1.
combinational and sequential circuits
2.
sequential circuits
3.
model checking
4.
model-checking
5.
verification by model checking
6.
model identification
7.
nonlinear model identification
8.
fault analysis model
9.
functional fault model
10.
high-level control fault model
11.
high-level fault model
12.
high-level functional fault model
13.
stuck-at fault model
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