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High-level decision diagrams based coverage metrics for verification and test (title)
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book article
High-level decision diagrams based coverage metrics for verification and test
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Reinsalu, Uljana
;
Ubar, Raimund-Johannes
LATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 2009
2009
/
[6] p. : ill
http://dx.doi.org/10.1109/LATW.2009.4813792
book article
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keyword
21
1.
high-level decision diagrams
2.
high-level decision diagrams (HLDD) synthesis
3.
High-level Decision Diagrams for Modeling Digital Systems
4.
high-level fault coverage
5.
high-level decision diagram
6.
high-level synthesis for test
7.
high-level test data generation
8.
verification, assertion-based verification, automatic assertion mining, data mining, association rule mining
9.
logic level and high level BDDs
10.
Binary Decision Diagrams
11.
binary decision diagrams (BDD)
12.
decision diagrams
13.
highlevel decision diagrams
14.
shared structurally synthesized Binary Decision Diagrams
15.
Structural Decision Diagrams for Modeling Digital Circuits
16.
test coverage
17.
register transfer level modeling decision diagams
18.
strategic level decision makers
19.
assertion-based verification
20.
model-based verification
21.
simulation-based verification
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