High-level decision diagrams based coverage metrics for verification and test
statement of authorship
Maksim Jenihhin, Jaan Raik, Anton Chepurov, Uljana Reinsalu, Raimund Ubar
source
LATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 2009
location of publication
[S.l.]
publisher
year of publication
pages
[6] p. : ill
conference name, date
10th IEEE Latin American Test Workshop, 2-5 March, 2009
conference location
Rio de Janero, Brazil
subject term
ISBN
978-1-4244-4206-5
notes
Bibliogr.: 10 ref
TTÜ department
language
inglise
Jenihhin, M., Raik, J., Tšepurov, A., Reinsalu, U., Ubar, R.-J. High-level decision diagrams based coverage metrics for verification and test // LATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 2009. [S.l.] : IEEE, 2009. [6] p. : ill.