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2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium (source)
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book article
An external test approach for network-on-a-chip switches
Raik, Jaan
;
Govind, Vineeth
;
Ubar, Raimund-Johannes
2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium
2011
/
p. 185-190 : ill
book article
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book article
Untestable fault identification in sequential circuits using model-checking
Raik, Jaan
;
Fujiwara, Hideo
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium
2011
/
p. 257-262 : ill
https://ieeexplore.ieee.org/document/4711554
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