A new approach to build a low-level malicious fault list starting from high-level description and alternative graphs
author
statement of authorship
A.Benso, P.Prinetto, M.Rebaudengo, M.Sonza, R.Ubar
source
Proceedings IEEE European Design & Test Conference, Paris, March 17-20, 1997
location of publication
[S.l.]
year of publication
pages
p. 560-565
language
inglise
Benso, A., Prinetto, P., Rebaudengo, M., Sonza, M., Ubar, R. A new approach to build a low-level malicious fault list starting from high-level description and alternative graphs // Proceedings IEEE European Design & Test Conference, Paris, March 17-20, 1997. [S.l.], 1997. p. 560-565. https://ieeexplore.ieee.org/document/582417