DOT: new deterministic defect-oriented ATPG tool
statement of authorship
Jaan Raik, Raimund Ubar, Joachim Sudbrock, Wieslaw Kuzmicz, Witold Pleskacz
location of publication
Los Alamitos
publisher
year of publication
pages
p. 96-101 : ill
ISBN
0-7695-2341-2
notes
Bibliogr.: 10 ref
Raik, J., Ubar, R.-J., Sudbrock, J., Kuzmicz, W., Pleskacz, W. DOT: new deterministic defect-oriented ATPG tool // European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedings. Los Alamitos : IEEE, 2005. p. 96-101 : ill.