Raik, J., Ubar, R.-J., Sudbrock, J., Kuzmicz, W., Pleskacz, W.

full record print

DOT: new deterministic defect-oriented ATPG tool

author

Raik, Jaan

Ubar, Raimund-Johannes

Sudbrock, Joachim

Kuzmicz, Wieslaw

Pleskacz, Witold A.

statement of authorship

Jaan Raik, Raimund Ubar, Joachim Sudbrock, Wieslaw Kuzmicz, Witold Pleskacz

source

European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedings

location of publication

Los Alamitos

publisher

IEEE

year of publication

2005

pages

p. 96-101 : ill

ISBN

0-7695-2341-2

notes

Bibliogr.: 10 ref

Raik, J., Ubar, R.-J., Sudbrock, J., Kuzmicz, W., Pleskacz, W. DOT: new deterministic defect-oriented ATPG tool // European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedings. Los Alamitos : IEEE, 2005. p. 96-101 : ill.