Fault simulation with parallel critical path tracing for combinational circuits using structurally synthesized BDDs
statement of authorship
Sergei Devadze, Jaan Raik, Artur Jutman, Raimund Ubar
location of publication
Porto Alegre
publisher
year of publication
pages
p. 97-102 : ill
conference name, date
7th IEEE Latin American Test Workshop LATW'06, March 26-29, 2006
conference location
Buenos Aires, Argentina
subject term
ISBN
85-7727-022-X
notes
Bibliogr.: 15 ref
TTÜ department
language
inglise
Devadze, S., Raik, J., Jutman, A., Ubar, R.-J. Fault simulation with parallel critical path tracing for combinational circuits using structurally synthesized BDDs // 7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings. Porto Alegre : Evangraf, 2006. p. 97-102 : ill.