Abideen, Z.U., Wang, R., Perez, T.D., Schrijen, G-J., Pagliarini, S.N.

full record print

Impact of orientation on the bias of SRAM-based PUFs

author

Abideen, Zain Ul

Wang, Rui

Perez, Tiago Diadami

Schrijen, Geert-Jan

Pagliarini, Samuel Nascimento

statement of authorship

Zain Ul Abideen, Rui Wang, Tiago Diadami Perez, Geert-Jan Schrijen, Samuel Pagliarini

source

IEEE design & test

publisher

IEEE

journal volume number month

vol. 14, 3

year of publication

2024

pages

p. 14-20

url

https://doi.org/10.1109/MDAT.2023.3322621

ISSN

2168-2356

2168-2364

Open Access

scientific publication

teaduspublikatsioon

language

inglise

Märksõnad ja võtmesõnad

subject term

orientatsioon

hoiakud

integraallülitused

riistvara

transistorid

pooljuhtseadised

keyword

Entropy

Random access memory

Integrated circuits

Layout

Hardware security

Transistors

Semiconductor device measurement

Teaduspublikatsiooni meetrika

classifier

1.1

TalTechi üksused

TTÜ department

arvutisüsteemide instituut

Abideen, Z.U., Wang, R., Perez, T.D., Schrijen, G-J., Pagliarini, S.N. Impact of orientation on the bias of SRAM-based PUFs // IEEE design & test (2024) vol. 14, 3, p. 14-20. https://doi.org/10.1109/MDAT.2023.3322621