Abideen, Z.U., Wang, R., Perez, T.D., Schrijen, G-J., Pagliarini, S.N.

Impact of orientation on the bias of SRAM-based PUFs

author

Abideen, Zain Ul

Wang, Rui

Perez, Tiago Diadami

Schrijen, Geert-Jan

Pagliarini, Samuel Nascimento

statement of authorship

Zain Ul Abideen, Rui Wang, Tiago Diadami Perez, Geert-Jan Schrijen, Samuel Pagliarini

source

IEEE design & test

publisher

IEEE

journal volume number month

vol. 14, 3

year of publication

2024

pages

p. 14-20

url

https://doi.org/10.1109/MDAT.2023.3322621

subject term

orientatsioon

hoiakud

integraallülitused

riistvara

transistorid

pooljuhtseadised

keyword

Entropy

Random access memory

Integrated circuits

Layout

Hardware security

Transistors

Semiconductor device measurement

ISSN

2168-2356

2168-2364

Open Access

scientific publication

teaduspublikatsioon

classifier

1.1

TTÜ department

arvutisüsteemide instituut

language

inglise

Abideen, Z.U., Wang, R., Perez, T.D., Schrijen, G-J., Pagliarini, S.N. Impact of orientation on the bias of SRAM-based PUFs // IEEE design & test (2024) vol. 14, 3, p. 14-20. https://doi.org/10.1109/MDAT.2023.3322621