Defect-oriented test- and layout-generation for standard-cell ASIC designs
statement of authorship
Joachim Sudbrock, Jaan Raik, Raimund Ubar, Wieslaw Kuzmicz, Witold Pleskacz
location of publication
Los Alamitos
publisher
year of publication
pages
p. 79-82 : ill
ISBN
0-7695-2433-8
notes
Bibliogr.: 11 ref
language
inglise
Sudbrock, J., Raik, J., Ubar, R.-J., Kuzmicz, W., Pleskacz, W. Defect-oriented test- and layout-generation for standard-cell ASIC designs // Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 2005. Los Alamitos : IEEE Computer Society, 2005. p. 79-82 : ill.