Jervan, G., Eles, P., Peng, Z., Raik, J., Ubar, R.

full record print

High-level test synthesis with hierarchical test generation

author

Jervan, Gert

Eles, Petru

Peng, Zebo

Raik, Jaan

Ubar, Raimund-Johannes

statement of authorship

Gert Jervan, Petru Eles, Zebo Peng, Jaan Raik, Raimund Ubar

source

17th NORCHIP Conference : Oslo, Norway, 8-9 November 1999 : proceedings

location of publication

[S.l.]

publisher

IEEE

year of publication

1999

pages

p. 291-296

ISBN

87-982637-2-2

notes

Bibl. 9 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

testid

testimine

süntees

Jervan, G., Eles, P., Peng, Z., Raik, J., Ubar, R. High-level test synthesis with hierarchical test generation // 17th NORCHIP Conference : Oslo, Norway, 8-9 November 1999 : proceedings. [S.l.] : IEEE, 1999. p. 291-296.