Jervan, G., Markus, A., Raik, J., Ubar, R.

full record print

Automatic test generation system for VLSI

author

Jervan, Gert

Markus, Antti

Raik, Jaan

Ubar, Raimund-Johannes

statement of authorship

G. Jervan, A. Markus, J. Raik, R. Ubar

source

Proceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 1997

location of publication

[S.l.]

year of publication

1997

pages

p. 255-258

language

inglise

Märksõnad ja võtmesõnad

subject term

VLSI-ahelad

testid

testimine

Jervan, G., Markus, A., Raik, J., Ubar, R. Automatic test generation system for VLSI // Proceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 1997. [S.l.], 1997. p. 255-258.