Jervan, G., Markus, A., Raik, J., Ubar, R.

prindi

Automatic test generation system for VLSI

autor

Jervan, Gert

Markus, Antti

Raik, Jaan

Ubar, Raimund-Johannes

vastutusandmed

G. Jervan, A. Markus, J. Raik, R. Ubar

allikas

Proceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 1997

ilmumiskoht

[S.l.]

ilmumisaasta

1997

leheküljed

p. 255-258

märksõna

VLSI-ahelad

testid

testimine

keel

inglise

Jervan, G., Markus, A., Raik, J., Ubar, R. Automatic test generation system for VLSI // Proceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 1997. [S.l.], 1997. p. 255-258.