A tool set for teaching design-for-testability of digital circuits
statement of authorship
S. Kostin, E. Orasson, R. Ubar
source
location of publication
[S.l.]
publisher
year of publication
pages
[6] p. : ill
conference name, date
11th European Workshop on Microelectronics Education, May 11-13, 2016
conference location
Southampton, UK
ISBN
978-1-4673-8584-8
notes
Bibliogr.: 12 ref
TTÜ department
language
inglise
subject term
keyword
design-for-testability
LFSR
stuck-at fault model
Kostin, S., Orasson, E., Ubar, R. A tool set for teaching design-for-testability of digital circuits // EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK. [S.l.] : IEEE, 2016. [6] p. : ill.