Cibakova, T., Fischerova, M., Gramatova, E., Kuzmicz, W., Pleskacz, W.A., Raik, J., Ubar, R.-J.*

full record print

Hierarchical test generation for combinational circuits with real defects coverage

author

Cibakova, Tatiana

Fischerova, Maria

Gramatova, Elena

Kuzmicz, W.

Pleskacz, Witold A.

Raik, Jaan

Ubar, Raimund-Johannes

statement of authorship

T.Cibakova, M.Fischerova, E.Gramatova, W.Kuzmicz, W.A.Pleskacz, J.Raik, R.Ubar

source

Microelectronics reliability

journal volume number month

vol. 42, 7

year of publication

2002

pages

p. 1141-1149 : ill

url

https://www.sciencedirect.com/science/article/pii/S002627140200080X

ISSN

0026-2714

notes

Bibliogr.: 25 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

elektriahelad

testimine

defektid

Cibakova, T., Fischerova, M., Gramatova, E., Kuzmicz, W., Pleskacz, W.A., Raik, J., Ubar, R.-J.* Hierarchical test generation for combinational circuits with real defects coverage // Microelectronics reliability (2002) vol. 42, 7, p. 1141-1149 : ill. https://www.sciencedirect.com/science/article/pii/S002627140200080X