print

Point defects interaction with extended defects in the Si-SiO2 system [Electronic resource]

author
Kropman, Daniel
Kärner, T.
Abru, Uno
Ugaste, Ülo
Mellikov, Enn
statement of authorship
D.Kropman, T.Kärner, U.Abru, Ü.Ugaste, E.Mellikov
source
Proceedings IVC-16 : Venice, 2004
year of publication
2004
pages
p. SS1-TuP394 [CD-ROM]
url
https://www.researchgate.net/publication/243760197_Point_Defects_Interaction_with_Extended_Defects_and_Impurities_and_Its_Influence_on_the_Si-SiO_2_System_Properties
subject term
punktdefektid
elektroni paramagnetresonantsspektroskoopia
tuumamagnetresonants
räni
ränioksiid
language
inglise
Kropman, D., Kärner, T., Abru, U., Ugaste, Ü., Mellikov, E. Point defects interaction with extended defects in the Si-SiO2 system [Electronic resource] // Proceedings IVC-16 : Venice, 2004., 2004. p. SS1-TuP394 [CD-ROM]. https://www.researchgate.net/publication/243760197_Point_Defects_Interaction_with_Extended_Defects_and_Impurities_and_Its_Influence_on_the_Si-SiO_2_System_Properties