Point defects interaction with extended defects in the Si-SiO2 system [Electronic resource]
vastutusandmed
D.Kropman, T.Kärner, U.Abru, Ü.Ugaste, E.Mellikov
allikas
Proceedings IVC-16 : Venice, 2004
ilmumisaasta
leheküljed
p. SS1-TuP394 [CD-ROM]
märksõna
keel
inglise
Kropman, D., Kärner, T., Abru, U., Ugaste, Ü., Mellikov, E. Point defects interaction with extended defects in the Si-SiO2 system [Electronic resource] // Proceedings IVC-16 : Venice, 2004., 2004. p. SS1-TuP394 [CD-ROM].