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Efficient at-speed interconnect BIST and diagnosis framework

author
Jutman, Artur
statement of authorship
Artur Jutman
source
Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 2005
location of publication
[Tallinn]
publisher
[Tallinn University of Technology]
year of publication
2005
pages
p. 257-258 : ill
url
https://artiklid.elnet.ee/record=b1018804*est
subject term
elektronlülitused
testimine
diagnostika (tehnika)
notes
Bibliogr.: 8 ref
language
inglise
Jutman, A. Efficient at-speed interconnect BIST and diagnosis framework // Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 2005. [Tallinn] : [Tallinn University of Technology], 2005. p. 257-258 : ill. https://artiklid.elnet.ee/record=b1018804*est