print

Defect-oriented BIST quality analysis

author
Kruus, Helena
Ubar, Raimund-Johannes
Raik, Jaan
statement of authorship
H. Kruus, R. Ubar, J. Raik
source
BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia
location of publication
[Tallinn]
publisher
Tallinn University of Technology
year of publication
2010
pages
p. 153-156 : ill
conference name, date
12th Biennial Baltic Electronics Conference, 2010
conference location
Tallinn
subject term
VLSI-ahelad
testimine
diagnostika (tehnika)
kvaliteet
ISSN
1736-3705
ISBN
978-1-4244-7357-1
notes
Bibliogr.: 18 ref
language
inglise
Kruus, H., Ubar, R., Raik, J. Defect-oriented BIST quality analysis // BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia. [Tallinn] : Tallinn University of Technology, 2010. p. 153-156 : ill.