Influence of excitonic scattering on charge carrier ambipolar diffusion in silicon
autor
vastutusandmed
Enn Velmre and Andres Udal
allikas
ESSDERC'97 : proceedings of the 27th European Solid-State Device Research Conference, Stuttgart, Germany, 22-24 September 1997
ilmumiskoht
S.l.
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 212-215: ill
konverentsi nimetus, aeg
The 27th European Solid-State Device Research Conference, 22-24 September 1997
konverentsi toimumispaik
Stuttgart, Germany
leitav
märksõna
ISBN
2-86332-221-4
märkused
Bibl.: 18 ref
Open Access
Open Access
TTÜ struktuuriüksus
keel
inglise
Velmre, E., Udal, A. Influence of excitonic scattering on charge carrier ambipolar diffusion in silicon // ESSDERC'97 : proceedings of the 27th European Solid-State Device Research Conference, Stuttgart, Germany, 22-24 September 1997. S.l. : IEEE, 1997. p. 212-215: ill.