Multi-level test generation for digital systems at system, circuit and defect levels
autor
Ubar, Raimund-Johannes
vastutusandmed
R. Ubar
allikas
Proceedings of the 7th International Scientific Conference "Theory and Technique of Information Transmission, Reception and Processing" : Tuapse, October 1-4, 2001
ilmumiskoht
[Harkov]
kirjastus/väljaandja
[Harkov University of Technology]
ilmumisaasta
2001
leheküljed
p. 286-288
konverentsi nimetus, aeg
7th International Scientific Conference "Theory and Technique of Information Transmission, Reception and Processing", October 1-4, 2001
konverentsi toimumispaik
Tuapse, Russia
märksõna
digitaaltehnika
elektriahelad
rikked
testimine
keel
inglise