prindi

On the estimation of complex circuits functional failure rate by machine learning techniques

autor
Lange, Thomas
Balakrishnan, Aneesh
Glorieux, Maximilien
Alexandrescu, Dan
Sterpone, Luca
vastutusandmed
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
allikas
49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - DSN 2019 : Supplemental Volume : proceedings
ilmumiskoht
[S.l.]
kirjastus/väljaandja
IEEE
ilmumisaasta
2019
leheküljed
p. 35-41 : ill
konverentsi nimetus, aeg
2019 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks – Supplemental Volume (DSN-S), 24-27 June 2019
konverentsi toimumispaik
Portland, OR, USA
leitav
https://doi.org/10.1109/DSN-S.2019.00021
märksõna
vead
rikked
lineaarsed mudelid
vigade teooria
tehisõpe
võtmesõna
transient faults
single event effects
fault injection
gate-level netlist
machine learning
linear least squares
k-nearest neighbors
support vector regression
ISBN
978-1-7281-3028-6
märkused
Bibliogr.: 14 ref
TTÜ struktuuriüksus
arvutisüsteemide instituut
keel
inglise
Uurimisrühm
Töökindla arvutusriistvara keskus (TARK)
Lange, T., Balakrishnan, A., Alexandrescu, D. et al. On the estimation of complex circuits functional failure rate by machine learning techniques // 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - DSN 2019 : Supplemental Volume : proceedings. [S.l.] : IEEE, 2019. p. 35-41 : ill. https://doi.org/10.1109/DSN-S.2019.00021