Impurity interaction with point defects in the Si-SiO2 structures and its influence on the interface properties
vastutusandmed
D.Kropman, E.Mellikov, T.Kärner, Ü.Ugaste, T.Laas, I.Heinmaa, A.Medvid
ajakirja aastakäik number kuu
134
ilmumisaasta
leheküljed
p. 222-226 : ill
ISSN
0921-5107
märkused
Bibliogr.: 8 ref
keel
inglise
Kropman, D., Mellikov, E., Kärner, T., Ugaste, Ü., Laas, T., Heinmaa, I., Medvid, A.* Impurity interaction with point defects in the Si-SiO2 structures and its influence on the interface properties // Materials science and engineering : B (2006) 134, p. 222-226 : ill.