Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties
autor
Misiuk, Andrzej
vastutusandmed
Daniel Kropman, Enn Mellikov, Tiit Kärner, Ivo Heinmaa, Tõnu Laas, Charalampos A. Londos, Andrzej Misiuk
allikas
ajakirja aastakäik number kuu
Vol. 178/179
ilmumisaasta
leheküljed
p. 263-266
võtmesõna
ISSN
1012-0394
keel
inglise
Kropman, D., Mellikov, E., Kärner, T., Heinmaa, I., Laas, T., Londos, C.A., Misiuk, A. Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties // Solid state phenomena (2011) Vol. 178/179, p. 263-266.