prindi

Design error diagnosis with re-synthesis in combinational circuits

autor
Ubar, Raimund-Johannes
vastutusandmed
Raimund Ubar
allikas
Journal of electronic testing : theory and applications
ajakirja aastakäik number kuu
Volume 19
ilmumisaasta
2003
leheküljed
1, p. 73-82 : ill
leitav
https://link.springer.com/article/10.1023/A:1021948013402
märksõna
disain
rikked
diagnostika (tehnika)
simulatsioon
VLSI-ahelad
ISSN
0923-8174
märkused
Bibliogr.: 16 ref
keel
inglise
Ubar, R.-J. Design error diagnosis with re-synthesis in combinational circuits // Journal of electronic testing : theory and applications (2003) Volume 19, 1, p. 73-82 : ill. https://link.springer.com/article/10.1023/A:1021948013402