High-level functional test generation for microprocessor modules
vastutusandmed
Adeboye Stephen Oyeniran, Raimund Ubar
allikas
Proceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 2019
ilmumiskoht
Lodz
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 356-361 : ill
ISBN
978-83-63578-15-2
978-83-63578-16-9
978-1-7281-1740-9
märkused
Bibliogr.: 29 ref
TTÜ struktuuriüksus
keel
inglise
märksõna
võtmesõna
Oyeniran, A. S., Ubar, R. High-level functional test generation for microprocessor modules // Proceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 2019. Lodz : Lodz University of Technology, 2019. p. 356-361 : ill.