System modelling and measurement under the view of design of testability and fault diagnosis of analog circuits
autor
vastutusandmed
Ji-Gou Liu and Uwe Frühauf
ilmumiskoht
[Tallinn]
ilmumisaasta
leheküljed
p. 295-298: ill
ISBN
9985-59-026-0
märkused
Bibl. 4 ref
Liu, J.-G., Frühauf, U. System modelling and measurement under the view of design of testability and fault diagnosis of analog circuits // BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings. [Tallinn], 1996. p. 295-298: ill.