prindi

Improved testability calculation for digital circuits

autor
Ubar, Raimund-Johannes
Heinlaid, J.
Raun, L.
vastutusandmed
R. Ubar, J. Heinlaid, L. Raun
allikas
19th NORCHIP Conference, Kista, Sweden, 12-13 November 2001 : proceedings
ilmumiskoht
[S.l.]
ilmumisaasta
2001
leheküljed
p. 264-270 : ill
ISBN
87-982637-3-0
märkused
Bibliogr.: 11 ref
keel
inglise
Ubar, R.-J., Heinlaid, J., Raun, L. Improved testability calculation for digital circuits // 19th NORCHIP Conference, Kista, Sweden, 12-13 November 2001 : proceedings. [S.l.], 2001. p. 264-270 : ill.