prindi

DefSim-based exercises for studying defects in CMOS gates

autor
Jutman, Artur
Pleskacz, Witold A.
Boiko, Nikolai
Ubar, Raimund-Johannes
vastutusandmed
Artur Jutman, Witold Pleskacz, Nikolai Boiko, Raimund Ubar
allikas
EWME 2006 proceedings : 6th International Workshop on Microelectronics Education : 8-9 June, 2006, Stockholm, Sweden
ilmumiskoht
Stockholm
kirjastus/väljaandja
Royal Institute of Technology
ilmumisaasta
2006
leheküljed
p. 23-26 : ill
ISBN
91-7178-402-0
märkused
Bibliogr.: 8 ref
Jutman, A., Pleskacz, W., Boiko, N., Ubar, R.-J. DefSim-based exercises for studying defects in CMOS gates // EWME 2006 proceedings : 6th International Workshop on Microelectronics Education : 8-9 June, 2006, Stockholm, Sweden. Stockholm : Royal Institute of Technology, 2006. p. 23-26 : ill.