Jutman, A., Pleskacz, W., Boiko, N., Ubar, R.-J.

täiskirje prindi

DefSim-based exercises for studying defects in CMOS gates

autor

Jutman, Artur

Pleskacz, Witold A.

Boiko, Nikolai

Ubar, Raimund-Johannes

vastutusandmed

Artur Jutman, Witold Pleskacz, Nikolai Boiko, Raimund Ubar

allikas

EWME 2006 proceedings : 6th International Workshop on Microelectronics Education : 8-9 June, 2006, Stockholm, Sweden

ilmumiskoht

Stockholm

kirjastus/väljaandja

Royal Institute of Technology

ilmumisaasta

2006

leheküljed

p. 23-26 : ill

ISBN

91-7178-402-0

märkused

Bibliogr.: 8 ref

Jutman, A., Pleskacz, W., Boiko, N., Ubar, R.-J. DefSim-based exercises for studying defects in CMOS gates // EWME 2006 proceedings : 6th International Workshop on Microelectronics Education : 8-9 June, 2006, Stockholm, Sweden. Stockholm : Royal Institute of Technology, 2006. p. 23-26 : ill.