Otsing - TalTech teadusportaal

kuva

reasta

1

artikkel kogumikus

Action-based learning system for teaching digital electronics and testUbar, Raimund-Johannes; Wuttke, Heinz-DietrichMicroelectronics education : proceedings of the 3rd European Workshop on Microelectronics Education : France, May 18AMP19, 20002000 / p. 107-110 : ill

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2

artikkel ajakirjas

Arvuti nööpaugusAgur, UstusHorisont1976 / lk. 12-15 : ill https://www.ester.ee/record=b1072243*est http://www.digar.ee/id/nlib-digar:291330

artikkel ajakirjas

3

raamat

BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia)Rang, Toomas; Min, Mart; Ubar, Raimund-Johannes1994

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4

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BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia)1994 https://www.ester.ee/record=b2150914*est

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5

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BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, EstoniaRang, Toomas2002 http://www.ester.ee/record=b2150914*est

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6

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BEC 2004 : Baltic Electronics Conference : Post-Graduate Student Session : Tallinn University of Technology, October 3-6, 2004, Tallinn, Estonia2004 https://www.ester.ee/record=b1982896*est

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7

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BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 http://www.ester.ee/record=b2150914*est

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8

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BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics ConferenceRang, Toomas2006 http://www.ester.ee/record=b2150914*est

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9

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BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, EstoniaRang, Toomas2008 http://www.ester.ee/record=b2150914*est

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10

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BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 4-6, 2010, Tallinn, EstoniaRang, Toomas2010 http://www.ester.ee/record=b2150914*est

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11

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BEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia2012 http://www.ester.ee/record=b2150914*est

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12

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BEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, EstoniaRang, Toomas2014 http://www.ester.ee/record=b2150914*est

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13

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BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, EstoniaRang, Toomas2016 http://www.ester.ee/record=b2150914*est

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14

artikkel kogumikus

CAD in the education of microelectronics at the Technical University of BudapestSzekely, V.; Tarnay, K.Automation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section S / Tallinn Technical University1992 / p. 146-151

artikkel kogumikus

15

artikkel ajakirjas

[Christou, A. Integrating reliability into microelectronics manufacturing. Series on design and measurement in electronic engineering, edited by D.V.Morgan and H.L.Grubin. Wiley, Chichester, 1994. 349 p. : Book review]Velmre, EnnEngineering applications of artificial intelligence1996 / p. 97 https://www.ester.ee/record=b1200126*est

artikkel ajakirjas

16

artikkel kogumikus

Computer aided simulation of dynamic behaviour of the I²L flip-flopRang, ToomasMicroelectronics '82 : proceedings of the 3. Microelectronics Conference of the Socialist Countries ; from 5.-7. May 1982, Siófok, Hungary1982 / p. 153-154

artikkel kogumikus

17

artikkel ajakirjas

DAC 2000 - 37th Design Automation ConferenceEllervee, PeeterA & A2000 / 5, lk. 53-54 https://artiklid.elnet.ee/record=b1005204*est

artikkel ajakirjas

18

artikkel kogumikus

DefSim: measurement environment for CMOS defectsBorejko, Tomasz; Jutman, Artur; Pleskacz, Witold A.; Ubar, Raimund-Johannes2006 25th International Conference on Microelectronics : Belgrade, Serbia and Montenegro, 14-17 May 2006 : proceedings. Volume 22006 / p. 679-682 https://ieeexplore.ieee.org/document/1651048

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Design and test technology for dependable systems-on-chip2011 https://www.ester.ee/record=b4467408*est

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20

artikkel kogumikus

Development of e-learning course: myths and realityRang, Toomas; Rang, GalinaSymposium "Topical Problems of Education in the Field of Electrical and Power Engineering" : Kuressaare, Estonia, January 19-24, 20042004 / p. 9-11

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21

artikkel ajakirjas

Digitaalmikroelektroonika projekteeriminePõldre, JüriA & A1998 / 4, lk. 14-16

artikkel ajakirjas

22

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Digitaalsüsteemide diagnostikaUbar, Raimund-Johannes2005 http://www.ester.ee/record=b2097071*est

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23

artikkel ajalehes

Eesti mikroelektroonika osaleb maailma virtuaalses kaubamajasUbar, Raimund-JohannesEesti Päevaleht1998 / 12. veebr., Uus Meedia, lk. 6

artikkel ajalehes

24

artikkel kogumikus

E-learning environment in the area of digital microelectronicsJutman, Artur; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichITHET 2004 : proceedings of the Fifth International Conference on Information Technology based Higher Education and Training : 31 May - 2 June, 2004, Istanbul, Turkey2004 / p. 278-283 : ill

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25

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European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedingsCantarella, JD2005 https://www.ester.ee/record=b2300865*est

raamat

mikroelektroonika (märksõna)

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