Otsing - TalTech teadusportaal

kuva

reasta

76

artikkel kogumikus

Java technology based training system for teaching digital design and testDevadze, Sergei; Jutman, Artur; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 283-286 : ill

artikkel kogumikus

77

artikkel kogumikus

Laboratory training for teaching design and test of digital circuitsJutman, Artur; Ubar, Raimund-JohannesProceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 20002001 / p. 521-524 : ill https://pld.ttu.ee/~artur/papers/TestLabs-MIXDES01.pdf

artikkel kogumikus

78

artikkel ajakirjas

Learning digital test and diagnostics via internetUbar, Raimund-Johannes; Jutman, Artur; Kruus, Margus; Orasson, Elmet; Devadze, Sergei; Wuttke, Heinz-DietrichInternational journal of online engineering2007 / 1, [9] p. : ill https://www.db-thueringen.de/servlets/MCRFileNodeServlet/dbt_derivate_00032681/iJOE_1681-1221_03_2007_1_361.pdf

artikkel ajakirjas

79

artikkel ajakirjas

Learning digital test and diagnostics via internet [Electronic resource]Ubar, Raimund-Johannes; Jutman, Artur; Kruus, Margus; Orasson, Elmet; Devadze, Sergei; Wuttke, Heinz-DietrichInternational journal of computing & information sciences2006 / 2, p. 86-96 : ill

artikkel ajakirjas

80

artikkel kogumikus

LFSR polynomial and seed selection using genetic algorithmAleksejev, E.; Jutman, Artur; Ubar, Raimund-JohannesBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 179-182 : ill

artikkel kogumikus

81

artikkel ajalehes

Maagiline miljonipiir on peagi ületatud : [2003. a. ületab TTÜ Arengufondi ja Vilistlaskogu stipendiumide kogusumma 1 miljoni : stipendiumitunnistuste pidulikust kätteandmisest 7. nov. Tallinna Raekojas rohkem kui 30-le TTÜ stipendiaadile, ka vastavad küsimustele: Gunnar Okk, Artur Jutman ja Toomas Luman]Ummelas, Mart; Okk, Gunnar; Jutman, Artur; Luman, ToomasMente et Manu2002 / lk. 1 https://www.ester.ee/record=b1242496*est

artikkel ajalehes

82

artikkel kogumikus EST / artikkel kogumikus ENG

Marginal PCB assembly defect detection on DDR3/4 memory busOdintsov, Sergei; Jutman, Artur; Devadze, Sergei2017 IEEE International Test Conference (ITC 2017) : Forth Worth, Texas, USA, 31 October - 2 November 20172017 / p. 238-247 : ill https://doi.org/10.1109/TEST.2017.8242070 Conference proceedings at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

83

artikkel kogumikus

A method for crosstalk fault detection in on-chip busesBengtsson, Tomas; Jutman, Artur; Ubar, Raimund-Johannes; Kumar, ShashiNorchip : proceedings : Oulu, Finland, 21-22 November 20052005 / p. 285-288 : ill https://doi.org/10.1109/NORCHP.2005.1597045

artikkel kogumikus

84

artikkel kogumikus

Microprocessor modeling for board level test access automationDevadze, Sergei; Jutman, Artur; Tšertov, Anton; Ubar, Raimund-JohannesProceedings of 10th IEEE Workshop on RTL and High Level Testing : Hong Kong, November 27-28, 20092009 / ? p

artikkel kogumikus

85

artikkel kogumikus

Microprocessor-based system test using debug interfaceDevadze, Sergei; Jutman, Artur; Tšertov, Anton; Instenberg, Martin; Ubar, Raimund-Johannes26th Norchip Conference : Tallinn, Estonia, 17-18 November 2008 : formal proceedings2008 / p. 98-101 : ill http://dx.doi.org/10.1109/NORCHP.2008.4738291

artikkel kogumikus

86

artikkel kogumikus

Modeling microprocessor faults on high-level decision diagrams [Electronic resource]Ubar, Raimund-Johannes; Raik, Jaan; Jutman, Artur; Jenihhin, Maksim; Istenberg, Martin; Wuttke, Heinz-DietrichDSN 2008 : supplemental : 2008 IEEE International Conference on Dependable Systems & Networks With FTCS & DCC (DSN) : June 24-27, 2008, Anchorage, Alaska2008 / p. C17-C22 : ill. [CD-ROM] https://webhost.laas.fr/TSF/WDSN08/2ndWDSN08(LAAS)_files/Slides/WDSN08S-04-Ubar.pdf

artikkel kogumikus

87

artikkel kogumikus

New built-in self-test scheme for SoC interconnectJutman, Artur; Ubar, Raimund-Johannes; Raik, JaanThe 9th World Multi-Conference on Systemics, Cybernetics and Informatics : WMSCI 2005 : July 10-13, 2005, Orlando, Florida, USA. Vol. IV2005 / p. 19-24 : ill https://www.researchgate.net/publication/237375234_New_Built-In_Self-Test_Scheme_for_SoC_Interconnect

artikkel kogumikus

88

artikkel kogumikus

A new FPGA-based detection method for spurious variations in PCBA power distribution networkOdintsov, Sergei; Bozzoli, Ludovica; De Sio, Corrado; Sterpone, Luca; Jutman, Artur2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings2019 / 6 p. : ill https://doi.org/10.1109/DDECS.2019.8724662

artikkel kogumikus

89

artikkel kogumikus

A novel artificial neural networks based automatic adaptive fault detection technique for analog circuitsPetlenkov, Eduard; Jutman, Artur; Nõmm, Sven; Ubar, Raimund-JohannesBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 167-170 : ill

artikkel kogumikus

90

artikkel kogumikus

Off-line testing of crosstalk induced glitch faults in NoC InterconnectsBengtsson, Tomas; Kumar, Shashi; Jutman, Artur; Ubar, Raimund-JohannesProceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 20062006 / p. 221-225 : ill http://dx.doi.org/10.1109/NORCHP.2006.329215

artikkel kogumikus

91

artikkel kogumikus

Off-line testing of delay faults in NoC interconnectsBengtsson, Tomas; Jutman, Artur; Kumar, Shashi; Peng, Zebo; Ubar, Raimund-Johannes9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings2006 / p. 677-680 : ill http://dx.doi.org/10.1109/DSD.2006.72

artikkel kogumikus

92

artikkel kogumikus

On coverage of timing related faults at board levelJutman, Artur; Aleksejev, Igor; Devadze, Sergei2016 21st IEEE European Test Symposium (ETS) : May 23rd-26th 2016, Amsterdam, The Netherlands : proceedings2016 / [2] p. : ill https://doi.org/10.1109/ETS.2016.7519295

artikkel kogumikus

93

artikkel kogumikus

On efficient logic-level simulation of digital circuits represented by the SSBDD modelJutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 22002 / p. 621-624 : ill https://ieeexplore.ieee.org/document/1003334

artikkel kogumikus

94

artikkel ajakirjas

On in-system programming of non-volatile memoriesTšertov, Anton; Devadze, Sergei; Jutman, Artur; Jasnetski, ArtjomInternational journal of microelectronics and computer science2013 / p. 72-78 : ill

artikkel ajakirjas

95

artikkel kogumikus

On in-system programming of non-volatile memoriesTšertov, Anton; Devadze, Sergei; Jutman, Artur; Jasnetski, ArtjomProceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2013, Gdynia, Poland, June 20-22, 20132013 / p. 408-413 : ill

artikkel kogumikus

96

artikkel kogumikus

On LFSR polynomial calculation for test time reductionJutman, ArturComputer Science Meets Automation : 10-13 September 2007 : proceedings. Volume II2007 / p. 153-158 : ill

artikkel kogumikus

97

artikkel kogumikus

On SSBDD model size & complexityJutman, ArturECS'03 : proceedings of the 4th Electronic Circuits and Systems Conference : September 11-12, 2003, Bratislava, Slovakia2003 / p. 17-22 https://pld.ttu.ee/~artur/papers/SSBDD_Model_Size-ECS03.pdf

artikkel kogumikus

98

artikkel kogumikus

On-chip sensors data collection and analysis for SoC health managementShibin, Konstantin; Jenihhin, Maksim; Jutman, Artur; Devadze, Sergei; Tsertov, Anton2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)2023 / 6 p https://doi.org/10.1109/DFT59622.2023.10313562

artikkel kogumikus

99

artikkel kogumikus

On-line fault classification and handling in IEEE1687 based fault management system for complex SoCsShibin, Konstantin; Devadze, Sergei; Jutman, ArturLATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 20162016 / p. 69-74 : ill https://doi.org/10.1109/LATW.2016.7483342

artikkel kogumikus

100

artikkel ajakirjas

Open-source JTAG simulator bundle for labsShibin, Konstantin; Devadze, Sergei; Rosin, Vjatšeslav; Jutman, Artur; Ubar, Raimund-JohannesInternational journal of electronics and telecommunications2012 / p. 233-239 : ill https://journals.pan.pl/Content/87192/PDF/32.pdf

artikkel ajakirjas

Jutman, Artur (TTÜ autor)

teaviku laadid

autor 33

CV 25

tema kohta 21

märksõna 1

TTÜ märksõna 1