prindi

New built-in self-test scheme for SoC interconnect

autor
Jutman, Artur
Ubar, Raimund-Johannes
Raik, Jaan
vastutusandmed
Artur Jutman, Raimund Ubar, and Jaan Raik
allikas
The 9th World Multi-Conference on Systemics, Cybernetics and Informatics : WMSCI 2005 : July 10-13, 2005, Orlando, Florida, USA. Vol. IV
ilmumiskoht
[Orlando]
kirjastus/väljaandja
International Institute of Informatics and Systemics
ilmumisaasta
2005
leheküljed
p. 19-24 : ill
leitav
https://www.researchgate.net/publication/237375234_New_Built-In_Self-Test_Scheme_for_SoC_Interconnect
märksõna
testimine
rikked
mudelid
diagnostika (tehnika)
riistvara
ISBN
980-6560-56-6
märkused
Bibliogr.: 26 ref
TTÜ struktuuriüksus
arvutitehnika instituut
keel
inglise
Jutman, A., Ubar, R.-J., Raik, J. New built-in self-test scheme for SoC interconnect // The 9th World Multi-Conference on Systemics, Cybernetics and Informatics : WMSCI 2005 : July 10-13, 2005, Orlando, Florida, USA. Vol. IV. [Orlando] : International Institute of Informatics and Systemics, 2005. p. 19-24 : ill. https://www.researchgate.net/publication/237375234_New_Built-In_Self-Test_Scheme_for_SoC_Interconnect