Otsing - TalTech teadusportaal

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101

artikkel kogumikus

Specification model and language HSL for digital systemsFrištacky, Norbert; Kacerik, JozefBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 133-136

artikkel kogumikus

102

artikkel kogumikus

Spectral analysis by crossings with properly chosen signalsRonk, AntsBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 205-208: ill

artikkel kogumikus

103

artikkel kogumikus

Structural test generation with employment of multiple observation time strategySkobtsov, VadimBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 299-302: ill

artikkel kogumikus

104

artikkel kogumikus

System modelling and measurement under the view of design of testability and fault diagnosis of analog circuitsLiu, Ji-Gou; Frühauf, UweBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 295-298: ill

artikkel kogumikus

105

artikkel kogumikus

Test generation for finite state machinesUbar, Raimund-Johannes; Brik, MarinaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 233-236: ill

artikkel kogumikus

106

artikkel kogumikus

Test pattern generation at the behavioral level from VHDL circuit description containing several processesGramatova, Elena; Bezakova, Jana; Cibakova, TatianaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 145-148

artikkel kogumikus

107

artikkel kogumikus

Test synthesis from register-transfer level descriptionsRaik, Jaan; Paomets, PriiduBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 311-314: ill

artikkel kogumikus

108

artikkel kogumikus

Testing flash A/D converters in real timeVedral, Josef; Krecl, JaromirBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 67-70: ill

artikkel kogumikus

109

artikkel kogumikus

The effective number of bits of analog sensorsBreitenbach, Arvid; Tammemägi, JaakBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 63-66: ill

artikkel kogumikus

110

artikkel kogumikus

The frequency shift and higher harmonic amplitudes evaluation for nonlinear oscillators : a frequency domain approachNeacsu, Cristian M.BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 333-336: ill

artikkel kogumikus

111

artikkel kogumikus

The hardware for artificial noseMisans, Peteris; Dzilums, Guntars; Shirs, JurisBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 425-428: ill

artikkel kogumikus

112

artikkel kogumikus

The silicon photodiodes as standard detectors in optical radiometryVeismann, Uno; Kübarsepp, Toomas; Vajakas, ToivoBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 341-342: ill

artikkel kogumikus

113

artikkel kogumikus

The software for artificial noseMisans, Peteris; Shirs, JurisBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 343-346: ill

artikkel kogumikus

114

artikkel kogumikus

Thermal investigations of microsystemsSzekely, VladimirBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 29-36: ill

artikkel kogumikus

115

artikkel kogumikus

Towards a unified model for test and design qualityAas, Einar J.BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 17-20: ill

artikkel kogumikus

116

artikkel kogumikus

Type approval test and certification of the terminal equipment of telecommunication network : documentation, organization, implementation in LithuaniaMašonis, Algis; Mykolaitis, Henrikas; Pleštys, Rimantas; Šimenas, GintautasBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 285-286

artikkel kogumikus

117

artikkel kogumikus

Verification of the test qualityMatrosova, Anjela; Bochun, TatianaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 307-310: ill

artikkel kogumikus

118

artikkel kogumikus

Very high-speed signal rectification using current conveyorsWilson, Brett; Dodd, Alan J.; Männama, VelloBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 421-424: ill

artikkel kogumikus

119

artikkel kogumikus

Voltage controlled current sources : dependence of the current phase on the load resistanceMärtin, Hannes; Gersing, EberhardBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 367-370: ill

artikkel kogumikus

120

artikkel kogumikus

Voltage inverter on GTO thyristorsPikkov, MihhailBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 487-488: ill

artikkel kogumikus

121

artikkel kogumikus

Workbench for design improvementFehlauer, Erhard; Feske, Klaus; Franke, Günter; Koegst, Manfred; Martin, Hans-Georg; Rülke, SteffenBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 249-252: ill

artikkel kogumikus

122

artikkel kogumikus

Yield optimization of circuits based on simulated annealing and gravity centers methodsZebbache, Ahmed; Siarry, PatrickBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 371-372: ill

artikkel kogumikus

BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings (allikas)

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