Sudbrock, Joachim (autor)

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  • artikkel kogumikus
    Defect-oriented test- and layout-generation for standard-cell ASIC designsSudbrock, Joachim; Raik, Jaan; Ubar, Raimund-Johannes; Kuzmicz, Wieslaw; Pleskacz, Witold A.Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 79-82 : ill https://ieeexplore.ieee.org/document/1559781
    artikkel kogumikus
  • artikkel kogumikus
    Deterministic defect-oriented test generation for combinational circuitsRaik, Jaan; Ubar, Raimund-Johannes; Sudbrock, Joachim; Kuzmicz, Wieslaw; Pleskacz, Witold A.LATW 2005 : 6th IEEE Latin-American Test Workshop : March 30 - April 2, 2005, Salvador, Bahia, Brazil : [digest of papers]2005 / p. 325-330 : ill
    artikkel kogumikus
  • artikkel kogumikus
    DOT: new deterministic defect-oriented ATPG toolRaik, Jaan; Ubar, Raimund-Johannes; Sudbrock, Joachim; Kuzmicz, Wieslaw; Pleskacz, Witold A.European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedings2005 / p. 96-101 : ill
    artikkel kogumikus
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