prindi

Deterministic defect-oriented test generation for combinational circuits

autor
Raik, Jaan
Ubar, Raimund-Johannes
Sudbrock, Joachim
Kuzmicz, Wieslaw
Pleskacz, Witold A.
vastutusandmed
Jaan Raik, Raimund Ubar, Joachim Sudbrock, Wieslaw Kuzmicz, Witold Pleskacz
allikas
LATW 2005 : 6th IEEE Latin-American Test Workshop : March 30 - April 2, 2005, Salvador, Bahia, Brazil : [digest of papers]
ilmumiskoht
[S. l.]
ilmumisaasta
2005
leheküljed
p. 325-330 : ill
märkused
Bibliogr.: 10 ref
Raik, J., Ubar, R.-J., Sudbrock, J., Kuzmicz, W., Pleskacz, W. Deterministic defect-oriented test generation for combinational circuits // LATW 2005 : 6th IEEE Latin-American Test Workshop : March 30 - April 2, 2005, Salvador, Bahia, Brazil : [digest of papers]. [S. l.], 2005. p. 325-330 : ill.