Otsing - TalTech teadusportaal

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1

artikkel kogumikus

Alternative graphs as a mathematical tool and knowledge representation for diagnosis purposes in digital systemsUbar, Raimund-JohannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 285-292: ill

artikkel kogumikus

2

artikkel kogumikus

An ontology-based intelligent learning object for teaching the basics of digital logicRobal, Tarmo; Kann, Taavi; Kalja, Ahto2011 IEEE International Conference on Microelectronic Systems Education (MSE) : 5-6 June 2011, San Diego, CA, USA2011 / p. 106-107

artikkel kogumikus

3

artikkel ajakirjas

Application of structurally synthesized binary decision diagrams for timing simulation of digital circuitsJutman, Artur; Ubar, Raimund-JohannesProceedings of the Estonian Academy of Sciences. Engineering2001 / 4, p. 269-288 : ill

artikkel ajakirjas

4

raamat

BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia)Rang, Toomas; Min, Mart; Ubar, Raimund-Johannes1994

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5

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BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia)1994 https://www.ester.ee/record=b2150914*est

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6

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BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, EstoniaRang, Toomas2002 http://www.ester.ee/record=b2150914*est

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7

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BEC 2004 : Baltic Electronics Conference : Post-Graduate Student Session : Tallinn University of Technology, October 3-6, 2004, Tallinn, Estonia2004 https://www.ester.ee/record=b1982896*est

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8

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BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 http://www.ester.ee/record=b2150914*est

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9

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BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics ConferenceRang, Toomas2006 http://www.ester.ee/record=b2150914*est

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10

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BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, EstoniaRang, Toomas2008 http://www.ester.ee/record=b2150914*est

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11

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BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 4-6, 2010, Tallinn, EstoniaRang, Toomas2010 http://www.ester.ee/record=b2150914*est

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12

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BEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia2012 http://www.ester.ee/record=b2150914*est

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13

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BEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, EstoniaRang, Toomas2014 http://www.ester.ee/record=b2150914*est

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14

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BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, EstoniaRang, Toomas2016 http://www.ester.ee/record=b2150914*est

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15

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BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedingsRang, Toomas; Min, Mart; Ubar, Raimund-Johannes1996 https://www.ester.ee/record=b2150914*est

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16

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BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedingsRang, Toomas1998 https://www.ester.ee/record=b2150914*est

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17

artikkel kogumikus

A BIST scheme for testing mixed analogue and digital circuitsRobson, Malcolm; Russel, GordonBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 183-186: ill

artikkel kogumikus

18

artikkel kogumikus

Calculation of testability measures on structurally synthesized binary decision diagramsUbar, Raimund-Johannes; Heinlaid, J.; Raik, Jaan; Raun, L.BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 179-182: ill

artikkel kogumikus

19

artikkel kogumikus

Calculation of the diagnosibility of digital circuits without using fault modelsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 159-162 : ill

artikkel kogumikus

20

artikkel ajakirjas

Case study in testing digital systemsUbar, Raimund-JohannesBaltic electronics1995 / 1, p. 24-27

artikkel ajakirjas

21

artikkel kogumikus

A CMOS quadrature baseband frequency synthesizer/modulatorKosunen, Marko; Vankka, Jouko; Waltari, Mikko; Sumanen, Lauri; Koli, Kimmo; Halonen, KariBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 219-222: ill

artikkel kogumikus

22

artikkel kogumikus

Collaborative distributed computing in the field of digital electronics testingIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesBalanced Automation Systems for Future Manufacturing Networks : 9th IFIP WG 5.5 International Conference : BASYS 2010 : Valencia, Spain, July 21-23, 2010 : proceedings2010 / p. 145-152

artikkel kogumikus

23

artikkel kogumikus

Collaborative distributed fault simulation for digital electronic circuitsIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesIntelligent Distributed Computing IV : proceedings of the 4th International Symposium on Intelligent Distributed Computing - IDC 2010 : Tangier, Morocco, September 20102010 / p. 67-76

artikkel kogumikus

24

artikkel kogumikus

Defect-oriented modul-level fault diagnosis in digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, JaanProceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany2011 / p. 81-86

artikkel kogumikus

25

raamat

Digitaalelektroonika : laboratoorsete tööde kogumik1994 http://www.ester.ee/record=b1065462*est

raamat

digitaalelektroonika (märksõna)

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