prindi

Calculation of the diagnosibility of digital circuits without using fault models

autor
Ubar, Raimund-Johannes
Kostin, Sergei
Raik, Jaan
vastutusandmed
R.Ubar, S.Kostin, J.Raik
allikas
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
ilmumiskoht
[Tallinn]
kirjastus/väljaandja
Tallinn University of Technology
ilmumisaasta
2008
leheküljed
p. 159-162 : ill
märksõna
digitaalelektroonika
diagnostika (tehnika)
rikked
mudelid
ISBN
978-1-4244-2059-9
märkused
Bibliogr.: 10 ref
keel
inglise
Ubar, R., Kostin, S., Raik, J. Calculation of the diagnosibility of digital circuits without using fault models // BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia. [Tallinn] : Tallinn University of Technology, 2008. p. 159-162 : ill.