Composing graph theory and deep neural networks to evaluate SEU type soft error effects
vastutusandmed
Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
allikas
9th Mediterranean Conference on Embedded Computing (MECO'2020), Budva, Montenegro, 8-11 June 2020
ilmumiskoht
Danvers
kirjastus/väljaandja
ilmumisaasta
konverentsi nimetus, aeg
9th Mediterranean Conference on Embedded Computing (MECO'2020), 8-11 June 2020
konverentsi toimumispaik
Budva, Montenegro
märkused
Bibliogr.: 10 ref
TTÜ struktuuriüksus
keel
inglise
võtmesõna
gate-level circuit abstraction
Single Event Transient (SET) and Soft Errors
Balakrishnan, A., Lange, T., Glorieux, M., Alexandrescu, D., Jenihhin, M. Composing graph theory and deep neural networks to evaluate SEU type soft error effects // 9th Mediterranean Conference on Embedded Computing (MECO'2020), Budva, Montenegro, 8-11 June 2020. Danvers : IEEE, 2020.