prindi

Comparison of individual SiC JBS chips and JBS stacks connected in series by diffusion welding

autor
Sleptšuk, Natalja
Korolkov, Oleg
Toompuu, Jana
Rang, Toomas
vastutusandmed
N. Sleptšuk, O. Korolkov, J. Toompuu, T. Rang
allikas
BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia
ilmumiskoht
[Tallinn]
kirjastus/väljaandja
Tallinn University of Technology
ilmumisaasta
2010
leheküljed
p. 81-84 : ill
konverentsi nimetus, aeg
12th Biennial Baltic Electronics Conference, 2010
konverentsi toimumispaik
Tallinn
märksõna
ränikarbiid
pooljuhtseadised
spektroskoopia
keevitus
difusioon (füüsika)
ISSN
1736-3705
ISBN
978-1-4244-7357-1
märkused
Bibliogr.: 5 ref
keel
inglise
Sleptsuk, N., Korolkov, O., Toompuu, J., Rang, T. Comparison of individual SiC JBS chips and JBS stacks connected in series by diffusion welding // BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia. [Tallinn] : Tallinn University of Technology, 2010. p. 81-84 : ill.