Investigations of the diagnosibility of digital networks with BIST
                                            vastutusandmed
                                    
                                    
Raimund Ubar, Sergei Kostin, Jaan Raik
                                                    
                                            
                                            ilmumiskoht
                                    
                                    
Rio de Janeiro
                                                    
                                            
                                            kirjastus/väljaandja
                                    
                                    
                                
                                            ilmumisaasta
                                    
                                    
                                
                                            leheküljed
                                    
                                    
[6] p. : ill
                                                    
                                            
                                            ISBN
                                    
                                    
978-1-4244-4206-5
                                                    
                                            
                                            märkused
                                    
                                    
Bibliogr.: 8 ref
                                                    
                                            
                                            keel
                                    
                                    
inglise
                                                    
                                            
                            Ubar, R.-J., Kostin, S., Raik, J. Investigations of the diagnosibility of digital networks with BIST // 10th IEEE Latin American Test Workshop : 2-5 March 2009, Brazil. Rio de Janeiro : IEEE, 2009. [6] p. : ill.