prindi

Design-for-testability for application of external test patterns in a NoC

autor
Govind, Vineeth
Raik, Jaan
vastutusandmed
V.Govind, J.Raik
allikas
2nd Workshop on Diagnostic Services in Network-on-Chips - Test, Debug, and On-Line Monitoring, in conjunction with Design Automation Conference (DAC)
ilmumiskoht
Anaheim
ilmumisaasta
2008
leheküljed
[4] p
märksõna
disain
testimine
keel
inglise
Govind, V., Raik, J. Design-for-testability for application of external test patterns in a NoC // 2nd Workshop on Diagnostic Services in Network-on-Chips - Test, Debug, and On-Line Monitoring, in conjunction with Design Automation Conference (DAC). Anaheim, 2008. [4] p.