Design error localization in digital circuits by stuck-at fault test patterns
vastutusandmed
A.Jutman, R.Ubar
allikas
[MIEL] 2000 : 22nd International Conference on Microelectronics : Niš, Yugoslavia, 14-17 May 2000 : proceedings. Volume 2
ilmumiskoht
[S. l.]
kirjastus/väljaandja
Electron Devices Society
ilmumisaasta
leheküljed
p. 723-726
ISBN
0-7803-5235-1
märkused
Bibliogr.: 10 ref
Jutman, A., Ubar, R. Design error localization in digital circuits by stuck-at fault test patterns // [MIEL] 2000 : 22nd International Conference on Microelectronics : Niš, Yugoslavia, 14-17 May 2000 : proceedings. Volume 2. [S. l.] : Electron Devices Society, 2000. p. 723-726.