prindi

Mapping physical defects to logic level for defect oriented testing

autor
Ubar, Raimund-Johannes
vastutusandmed
R. Ubar
allikas
SCS 2003 : International Symposium on Signals, Circuits and Systems : July 10-11, 2003, Iasi, Romania : proceedings. Vol. 2
ilmumiskoht
Piscataway
kirjastus/väljaandja
IEEE
ilmumisaasta
2003
leheküljed
p. 453-456 : ill
konverentsi nimetus, aeg
SCS 2003, International Symposium on Signals, Circuits and Systems, July 10-11, 2003
konverentsi toimumispaik
Iasi, Romania
leitav
https://ieeexplore.ieee.org/document/5731320
märksõna
testimine
defektid
ISBN
0-7803-7979-9
märkused
Bibliogr.: 6 ref
keel
inglise
Ubar, R.-J. Mapping physical defects to logic level for defect oriented testing // SCS 2003 : International Symposium on Signals, Circuits and Systems : July 10-11, 2003, Iasi, Romania : proceedings. Vol. 2. Piscataway : IEEE, 2003. p. 453-456 : ill. https://ieeexplore.ieee.org/document/5731320