prindi

Collaborative distributed computing in the field of digital electronics testing

autor
Ivask, Eero
Devadze, Sergei
Ubar, Raimund-Johannes
vastutusandmed
Eero Ivask, Sergei Devadze and Raimund Ubar
allikas
Balanced Automation Systems for Future Manufacturing Networks : 9th IFIP WG 5.5 International Conference : BASYS 2010 : Valencia, Spain, July 21-23, 2010 : proceedings
ilmumiskoht
[S.l.]
kirjastus/väljaandja
Springer
ilmumisaasta
2010
leheküljed
p. 145-152
seeria-sari
IFIP Advances in Information and Communication Technology ; Vol. 322
konverentsi nimetus, aeg
9th IFIP WG 5.5 International Conference, BASYS 2010, July 21-23, 2010
konverentsi toimumispaik
Valencia, Spain
märksõna
digitaalintegraallülitused
digitaalelektroonika
kompuutersimulatsioon
ISBN
978-3-642-14341-0
keel
inglise
Ivask, E., Devadze, S., Ubar, R. Collaborative distributed computing in the field of digital electronics testing // Balanced Automation Systems for Future Manufacturing Networks : 9th IFIP WG 5.5 International Conference : BASYS 2010 : Valencia, Spain, July 21-23, 2010 : proceedings. [S.l.] : Springer, 2010. p. 145-152. (IFIP Advances in Information and Communication Technology ; Vol. 322).