Multiple-objective backtrace for solving test generation constraints
autor
Mekler, A.
vastutusandmed
A.Mekler, J.Raik
allikas
International Symposium on System-on-Chip : November 19-21, 2003, Tampere, Finland : proceedings
ilmumiskoht
Tampere
ilmumisaasta
leheküljed
p. 123-126 : ill
ISBN
0-7803-8160-2
märkused
Bibliogr.: 9 ref
keel
inglise
Mekler, A., Raik, J. Multiple-objective backtrace for solving test generation constraints // International Symposium on System-on-Chip : November 19-21, 2003, Tampere, Finland : proceedings. Tampere, 2003. p. 123-126 : ill.