Functional built-in self-test for processor cores in SoC
vastutusandmed
Raimund Ubar, Viljar Indus, Oliver Kalmend, Teet Evartson, Elmet Orasson
allikas
30th IEEE NORCHIP Conference : Copenhagen, Denmark, November 12-14, 2012
ilmumiskoht
[S.l.]
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 1-4 : ill
konverentsi nimetus, aeg
30th IEEE NORCHIP Conference, November 12-14, 2012
konverentsi toimumispaik
Copenhagen, Denmark
ISBN
978-1-4673-2223-2
märkused
Bibliogr.: 13 ref
keel
inglise
Ubar, R., Indus, V., Kalmend, O., Evartson, T., Orasson, E. Functional built-in self-test for processor cores in SoC // 30th IEEE NORCHIP Conference : Copenhagen, Denmark, November 12-14, 2012. [S.l.] : IEEE Computer Society, 2012. p. 1-4 : ill.