A tool set for teaching design-for-testability of digital circuits
author
Kostin, Sergei
Orasson, Elmet
Ubar, Raimund-Johannes
statement of authorship
S. Kostin, E. Orasson, R. Ubar
source
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
location of publication
[S.l.]
publisher
IEEE
year of publication
2016
pages
[6] p. : ill
conference name, date
11th European Workshop on Microelectronics Education, May 11-13, 2016
conference location
Southampton, UK
url
https://doi.org/10.1109/EWME.2016.7496466
subject term
elektronlülitused
rikked
testimine
arvutiprogrammid
e-õpe
keyword
e-learning
design-for-testability
test generation
built-in self-test
controllability
observability
LFSR
stuck-at fault model
fault simulation
ISBN
978-1-4673-8584-8
notes
Bibliogr.: 12 ref
TTÜ department
arvutitehnika instituut
language
inglise