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In-field detection of degradation on PCB assembly high-speed busesOdintsov, SergeiIEEE AUTOTESTCON 2018 : National Harbor, September 17-20, 2018 : proceedings2018 / 6 p.: ill https://doi.org/10.1109/AUTEST.2018.8532547

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Intelligent contingencgy overload-avoiding control of BESS for renewable-rich local areaGonzalez-Longatt, Francisco; Abdellah, Kouzou; Astapov, Victor; Olivo, Franklin; Rueda, Jose Luis; Palensky, Peter; Chamorro, Harold R.19th International Multi-Conference on Systems, Signals & Devices (SSD)2022 / p. 1638-1643 https://doi.org/10.1109/SSD54932.2022.9955825

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Investigation of steam turbine blades damage and reliability in a power plantMolodtsov, Artjom; Dedov, Andrei; Klevtsov, Ivan; Kommel, Lembit; Lausmaa, Toomas; Mikli, ValdekModern Materials and Manufacturing 2019 : 12th International DAAAM Baltic Conference and 27th International Baltic Conference BALTMATTRIB 2019. Selected, peer reviewed papers from the conference Modern Materials and Manufacturing 2019 (MMM 2019), April 24-26, 2019, Tallinn, Estonia2019 / p. 89-94 : ill https://www.scientific.net/KEM.799.89 https://www.ester.ee/record=b5235278*est https://doi.org/10.4028/www.scientific.net/KEM.799.89 Conference proceeding at Scopus Article at Scopus

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Logic-based implementation of fault-tolerant routing in 3D Network-on-ChipsNiazmand, Behrad; Azad, Siavoosh Payandeh; Flich, Jose; Raik, Jaan; Jervan, Gert; Hollstein, Thomas2016 Tenth IEEE/ACM International Symposium on Networks-on-Chip (NOCS) : Nara, Japan, 31 August - 2 September 20162016 / [8] p. : ill https://doi.org/10.1109/NOCS.2016.7579317

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Methods of condition monitoring and fault detection for electrical machinesKudelina, Karolina; Asad, Bilal; Vaimann, Toomas; Rassõlkin, Anton; Kallaste, Ants; Khang, Huynh VanEnergies2021 / art. 7459, 20 p. : ill https://doi.org/10.3390/en14227459 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Seotud publikatsioonid 1

Artificial intelligence driven approaches for fault prognostics of electrical machines using vibration spectrum analysis = Tehisintellektil põhinevad lähenemisviisid elektrimasinate rikete prognoosimiseks vibratsioonispektri analüüsi abil

31

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Mission profile-based accelerated testing of DC-link capacitors in photovoltaic invertersSangwongwanich, Ariya; Shen, Yanfeng; Chub, Andrii; Liivik, Elizaveta; Vinnikov, Dmitri; Wang, Huai; Blaabjerg, FredeThirty-Fourth Annual IEEE Applied Power Electronics Conference and Exposition, March 17 – 21, 2019, Anaheim, California2019 / p. 2833-2840 : ill https://doi.org/10.1109/APEC.2019.8721794 Conference proceedings at Scopus Article at Scopus Article at WOS

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32

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Operation of Single-Chip MOSFET and IGBT Devices after failure due to repetitive avalanche [Electronic resource]Blinov, Andrei; Norrga, Staffan; Tibola, GabrielEPE'15 ECCE Europe : 8-10 September 2015, Geneva, Switzerland : 17th European Conference on Power Electronics and Applications2015 / p. 1-9 : ill. [USB] http://dx.doi.org/10.1109/EPE.2015.7309190

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An overview of lifetime management of power electronic convertersRahimpour, Saeed; Tarzamni, Hadi; Vosoughi Kurdkandi, Naser; Husev, Oleksandr; Vinnikov, Dmitri; Tahami, FarzadIEEE Access2022 / p. 109688-109711 https://doi.org/10.1109/ACCESS.2022.3214320 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Seotud publikatsioonid 1

Common-ground energy router structure with enhanced reliability and protection = Ühise nulljuhtmega suurendatud töökindluse ja kaitsega energiaruuter

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Photovoltaic module characteristic influence on reliability of micro-invertersSangwongwanich, Ariya; Liivik, Elizaveta; Blaabjerg, Frede2018 IEEE 12th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG 2018) : Doha, Qatar, 10-12 April 20182018 / p. 478-483 : ill https://doi.org/10.1109/CPE.2018.8372565

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35

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Precision of thread manufacturing and its influence on durability of screws with different thread profilesStrižak, Viktor; Penkov, IgorMachines, technologies, materials2015 / p. 47-51 : ill http://stumejournals.com/mtm/Archive/2015/7-2015.pdf

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36

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Reliability analysis and energy yield of string-inverter considering monofacial and bifacial photovoltaic panelsBouguerra, Sara; Yaiche, Mohamed Redha; Sangwongwanich, Ariya; Blaabjerg, Frede; Liivik, Elizaveta2020 IEEE 11th International Symposium on Power Electronics for Distributed Generation Systems (PEDG), 28 Sept.-1 Oct. 2020, Dubrovnik, Croatia2020 / p. 199-204 https://doi.org/10.1109/PEDG48541.2020.9244425

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Reliability analysis of micro-inverters considering PV module variations and degradation ratesLiivik, Elizaveta; Sangwongwanich, Ariya; Blaabjerg, Frede2018 20th European Conference on Power Electronics and Applications (EPE'18 ECCE Europe) : Riga, Latvia, 17-21 September 20182018 / p. 1475-1482 : ill https://ieeexplore.ieee.org/document/8515325

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Reliability assessment of photovoltaic Buck-Boost microconverter for Estonian climate conditionsBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Vinnikov, Dmitri2023 IEEE 17th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG)2023 / 6 p https://doi.org/10.1109/CPE-POWERENG58103.2023.10227505

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39

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Reliability based design method for buckling of steel columns in fireKervalishvili, Andrei; Talvik, IvarJournal of Structural Fire Engineering2020 / p. 167 - 187 https://doi.org/10.1108/JSFE-12-2018-0041 Journal metrics at Journal Article at Scopus Journal metrics at WOS Article at WOS

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Reliability evaluation of an impedance-source PV microconverterShen, Yanfeng; Liivik, Elizaveta; Blaabjerg, Frede; Vinnikov, Dmitri; Wang, Huai; Chub, Andrii2018 IEEE Applied Power Electronics Conference and Exposition (APEC 2018), San Antonio, Texas, USA, 4-8 March 20182018 / p. 1104–1108 : ill https://doi.org/10.1109/APEC.2018.8341154 Conference proceedings at Scopus Article at Scopus Article at WOS

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41

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Reliability evaluation of isolated buck-boost DC-DC series resonant converterBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Shen, YanfengIEEE open journal of power electronics2022 / p. 131-141 https://doi.org/10.1109/OJPEL.2022.3157200 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Seotud publikatsioonid 1

Fault-tolerant galvanically isolated DC‑DC converters with zero redundancy = Null-liiasusega veatolerantsed galvaanilise isolatsiooniga alalispingemuundurid

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Reliability evaluation of the universal power electronic interface converter for PV applicationsKhan, Salman; Chub, Andrii; Vinnikov, Dmitri; Kasper, Matthias; Deboy, Gerald2024 IEEE 21st International Power Electronics and Motion Control Conference (PEMC)2024 / 8 p https://doi.org/10.1109/PEMC61721.2024.10726360

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Reliability of DC-link capacitors in two-stage micro-inverters under different PV module sizesSangwongwanich, Ariya; Shen, Yanfeng; Chub, Andrii; Liivik, Elizaveta; Vinnikov, Dmitri; Wang, Huai; Blaabjerg, FredeICPE 2019 - ECCE Asia : 10th International Conference on Power Electronics - ECCE Asia : "Green World with Power Electronics" : May 27-30, 2019 BEXCO, Busan, Korea2019 / p. 1867-1872 : ill https://ieeexplore.ieee.org/xpl/conhome/8786807/proceeding

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The reliability of stud-bolt jointsStrižak, Viktor; Penkov, IgorOST-97 Symposium on Machine Design, Tallinn, Estonia, May 22-23, 1997 : proceedings1997 / p. 196-204 : ill https://www.ester.ee/record=b1083704*est

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Reliability study of input side capacitors in impedance-source PV microconvertersLiivik, Elizaveta; Vinnikov, Dmitri; Chub, Andrii; Shen, YanfengIECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society : proceedings2019 / p. 5026–5032 : ill https://doi.org/10.1109/IECON.2019.8927173 Conference proceedings at Scopus Article at Scopus Article at WOS

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46

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RESCUE EDA Toolset for interdependent aspects of reliability, security and quality in nanoelectronic systems designGürsoy, Cemil Cem; Cardoso Medeiros, Guilherme; Chen, Juanho; Balakrishnan, Aneesh; Lai, Xinhui; Bagbaba, Ahmet Cagri; Raik, Jaan; Jenihhin, MaksimDATE 20192019 / 1 p. : ill https://doi.org/10.5281/zenodo.3362529 https://past.date-conference.com/

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47

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RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systemsJenihhin, Maksim; Raik, Jaan2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings2020 / art. 19690741 , 6 p https://doi.org/10.23919/DATE48585.2020.9116558

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48

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Scenario-based Validation for Autonomous Vehicles with Different Fidelity LevelsMalayjerdi, Mohsen; Kaljavesi, Gemb; Diermeyer, Frank; Sell, Raivo2023 IEEE Conference on Intelligent Transportation Systems (ITSC 2023)2023 / 6 p https://doi.org/10.1109/ITSC57777.2023.10422403

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journal article

Self-healing photovoltaic microconverter with zero redundancy and accurate low-cost fault detectionBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Vinnikov, DmitriIEEE transactions on industrial electronics2024 / p. 646-656 https://doi.org/10.1109/TIE.2023.3250836

journal article

Seotud publikatsioonid 1

Fault-tolerant galvanically isolated DC‑DC converters with zero redundancy = Null-liiasusega veatolerantsed galvaanilise isolatsiooniga alalispingemuundurid

50

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Sensorless pressure calculation for parallel redundancy in pumping systemsVodovozov, Valery; Bakman, Ilja2014 16th European Conference on Power Electronics and Applications (EPE'14-ECCE Europe) : Lappeenranta, Finland, 26-28 August 2014. Vol. 12014 / p. 210-218 : ill

book article

reliability (keyword)

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