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book article

Cycle-based simulation with decision diagramsUbar, Raimund-Johannes; Morawiec, Adam; Raik, JaanDesign, Automation and Test in Europe : DATE : Conference and Exhibition 1999 : Munich, Germany, March 9-12, 1999 : proceedings1999 / p. 454-458: ill https://ieeexplore.ieee.org/document/761165

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27

book article

A decision diagram based hierarchical test pattern generatorJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 159-162: ill

book article

28

journal article

Decision diagrams - from a mathematical notion to engineering applicationsStankovic, Radomir S.; Ubar, Raimund-Johannes; Astola, JaakkoFacta Universitatis [Niš]. Series electronics and energetics2011 / p. 281-301 : ill http://dx.doi.org/10.2298/FUEE1103281S

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29

book article

Decision diagrams and digital testUbar, Raimund-JohannesECMS 2003 : 6th International Workshop on Electronics, Control, Measurment and Signals : Liberec, Czechia, June 2-4, 20032003 / p. 266-273 : ill http://www.midem-drustvo.si/Journal%20papers/MIDEM_35(2005)4p187.pdf

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30

book article

Deductive fault simulation on structurally synthesized BDDsAarna, Margit; Ubar, Raimund-Johannes; Raik, JaanBEC 2004 : Baltic Electronics Conference : Post-Graduate Student Session : Tallinn University of Technology, October 3-6, 2004, Tallinn, Estonia2004 / p. 11 : ill

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31

book article

Defect-oriented fault simulation and test generation in digital circuitsKuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE ISQED 2001 : proceedings of the IEEE 2001 2nd International Symposium on Quality Electronic Design : March 26-28, 2001, San Jose, California2001 / p. 365-371 https://ieeexplore.ieee.org/document/915257

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32

journal article

Defect-oriented mixed-level fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaFacta Universitatis [Niš]. Series electronics and energetics2002 / 1, April, p. 123-136 : ill

journal article

33

book article

Defect-oriented test generation and fault simulation in the environment of MOSCITOSchneider, Andre; Diener, Karl-Heinz; Gramatova, Elena; Fisherova, Maria; Ivask, Eero; Ubar, Raimund-Johannes; Pleskacz, Witold A.; Kuzmicz, W.BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 303-306 : ill

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34

journal article EST / journal article ENG

Design and verification of Cyber-Physical Systems using TrueTime, evolutionary optimization and UPPAALBalasubramaniyan, Sreram; Srinivasan, Seshadhri; Buonopane, Furio; Balasubramanian, Subathra; Vain, Jüri; Ramaswamy, SriniMicroprocessors and microsystems2016 / p. 37-48 : ill https://doi.org/10.1016/j.micpro.2015.12.006 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

35

book article

Design error diagnosis in digital circuits without error modelUbar, Raimund-Johannes; Borrione, DominiqueVLSI : systems on a chip : IFIP TC10 WG10.5 Tenth International Conference on Very Large Scale Integration (VLSI'99) : December 1-4, 1999, Lisboa, Portugal1999 / p. 281-292 : ill https://www.researchgate.net/publication/292157544_Design_Error_Diagnosis_in_Digital_Circuits_without_Error_Model

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36

book article

Design error diagnosis using backtrace algorithm on decision diagramsRepinski, Urmas; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, Maksim; Tšepurov, AntonInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis2010 / p. 93-96

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37

book article

Diagnostic modeling of digital systems with multi-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Jutman, Artur; Jenihhin, MaksimDesign and test technology for dependable systems-on-chip2011 / p. 92-118 : ill https://www.researchgate.net/publication/344994231_Diagnostic_Modeling_of_Digital_Systems_with_Multi-Level_Decision_Diagrams

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38

book article

Diagnostic modelling of digital systems with binary and high-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Kruus, Helena; Lensen, Harri; Evartson, TeetProgress in industrial mathematics at ECMI 20062008 / p. 902-907 : ill https://link.springer.com/chapter/10.1007/978-3-540-71992-2_158

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39

journal article

Diagnostic modelling of digital systems with decision diagramsUbar, Raimund-JohannesВестник Томского государственного университета : приложение2004 / август, материалы международных, всесоюзных и региональных научных конференций, симпозиумов, школ, проводимых в ТГУ, с. 174-179 : ил

journal article

40

book article

Diagnostic modelling of digital systems with multi-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Evartson, Teet; Kruus, Margus; Lensen, HarriProceedings of the 17th IASTED International Conference on Modelling and Simulation : May 24-26, 2006, Montreal, Quebec, Canada2006 / p. 207-212 : ill

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41

newspaper article

Digievolutsiooni võimalused kooliharidusesJürjo, SilvesterStudioosus2015 / lk. 20-21 https://www.ester.ee/record=b1558644*est

newspaper article

42

book

Digitaalseadmete simuleerimine : õppemetoodiline vahend1989 https://www.ester.ee/record=b1221053*est

book

43

book

Digitaalseadmete struktuuri projekteerimine : õppevahendAriste, Andri1978 https://www.ester.ee/record=b1305228*est

book

44

book

Digitaalsüsteemide diagnostikaUbar, Raimund-Johannes2005 http://www.ester.ee/record=b2097071*est

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45

book article

Digitaalsüsteemide diagnostika Tallinna TehnikaülikoolisUbar, Raimund-JohannesTeadusmõte Eestis : tehnikateadused2002 / lk. 107-113 : ill

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46

book

Digitaaltehnika doktorantidele. Osa II, Kombinatsioon- ja järjendlülitused = Digital engineering. Part II, Combinational and sequential circuits [Võrguväljaanne]Lehtla, Madis2014 http://egdk.ttu.ee/files/2014/Digitaaltehnika_doktorantidele2.pdf

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47

journal article

DigitaalteleviisoridSchults, EduardSide. Raadio. Televisioon : infoseeria 101984 / lk. 8-10 : ill https://www.ester.ee/record=b1232303~S1*est

journal article

48

journal article

Digital design at microarch[i]tectural level based on quality relationship measuresKruus, Margus; Lensen, Harri; Sudnitsõn, AleksanderУспехи современного естествознания2004 / 5, приложение 1, Материалы XXXI международной конференции и дискуссионного научного клуба : информационные технологии в науке, образовании, телекоммуникации и бизнесе : IT+SE'2004 : Украина, Крым, Ялта-Гурзуф, 18-27 мая 2004 года, с. 29-30

journal article

49

journal article

Digital electronics design and test at Computer Engineering Department of Tallinn University of TechnologyUbar, Raimund-Johannes; Raik, Jaan; Jutman, Artur; Ellervee, PeeterThe house magazine : the parlamentary weekly2006 / 1198, p. 42 : ill

journal article

50

book article

Digital hardware organization course for SoC programEllervee, Peeter; Tenhunen, Hannu2001 International Conference on Microelectronic Systems Education : June 17-18, 2001, Las Vegas, Nevada, USA : proceedings2001 / p. 26-27 https://ieeexplore.ieee.org/document/932402

book article

digitaaltehnika (subject term)

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